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Journal Articles Applied Physics Letters Year : 2005

Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode

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hal-00320223 , version 1 (10-09-2008)

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  • HAL Id : hal-00320223 , version 1

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Frédéric Houzé, Pascal Chrétien, Olivier Schneegans, René Meyer, Lionel Boyer. Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode. Applied Physics Letters, 2005, 86, pp.123103. ⟨hal-00320223⟩
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