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Journal Articles Applied Physics Letters Year : 2007

Capacitance measurements on small parallel plate capacitors using nanoscale impedance microscopy

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hal-00320357 , version 1 (10-09-2008)

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  • HAL Id : hal-00320357 , version 1

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Olivier Schneegans, Frédéric Houzé, Pascal Chrétien, René Meyer. Capacitance measurements on small parallel plate capacitors using nanoscale impedance microscopy. Applied Physics Letters, 2007, 90, pp.043116. ⟨hal-00320357⟩
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