Journal Articles
Applied Physics Letters
Year : 2007
Olivier Schneegans : Connect in order to contact the contributor
https://centralesupelec.hal.science/hal-00320357
Submitted on : Wednesday, September 10, 2008-5:26:49 PM
Last modification on : Friday, March 24, 2023-2:52:50 PM
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- HAL Id : hal-00320357 , version 1
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Olivier Schneegans, Frédéric Houzé, Pascal Chrétien, René Meyer. Capacitance measurements on small parallel plate capacitors using nanoscale impedance microscopy. Applied Physics Letters, 2007, 90, pp.043116. ⟨hal-00320357⟩
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