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New approach to capacitance spectroscopy for interface characterization of a-Si:H/c-Si heterojunctions

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hal-00321574 , version 1 (15-09-2008)

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  • HAL Id : hal-00321574 , version 1

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Alexander Gudovskikh, Jean-Paul Kleider, R. Stangl. New approach to capacitance spectroscopy for interface characterization of a-Si:H/c-Si heterojunctions. 21st International Conference on Amorphous and Nanocrystalline Semiconductors, 2005, Portugal. ⟨hal-00321574⟩
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