This article deals with a Built-in Self-Test method using only a one-bit ADC and a one-bit DAC, for use in a context of MEMS and microelectronics. It is theoretically possible to use a binary white noise and binary observations to estimate the impulse response and the output of a linear system, provided this system has good mixing properties. We show how this can be easily implemented on digital targets. The FPGA-based identification of the impulse response of a bandpass filter is performed and the experimental results are presented.