Characterization of amorphous/crystalline silicon interfaces from electrical measurements - CentraleSupélec Access content directly
Conference Papers Year : 2008

Characterization of amorphous/crystalline silicon interfaces from electrical measurements

A.S. Gudovskikh
  • Function : Author
No file

Dates and versions

hal-00351223 , version 1 (08-01-2009)

Identifiers

  • HAL Id : hal-00351223 , version 1

Cite

Jean-Paul Kleider, A.S. Gudovskikh. Characterization of amorphous/crystalline silicon interfaces from electrical measurements. MRS Spring Meeting, Mar 2008, San Francisco, United States. ⟨hal-00351223⟩
21 View
0 Download

Share

Gmail Mastodon Facebook X LinkedIn More