Comparative Study of Coil Arrangements for the EC Testing of Small Surface Breaking Defects - CentraleSupélec
Article Dans Une Revue Studies in Applied Electromagnetics and Mechanics Année : 2008

Comparative Study of Coil Arrangements for the EC Testing of Small Surface Breaking Defects

Pierre-Yves Joubert
Claude Marchand
Fichier non déposé

Dates et versions

hal-00354401 , version 1 (19-01-2009)

Identifiants

  • HAL Id : hal-00354401 , version 1

Citer

Cyril Ravat, Yann Le Bihan, Pierre-Yves Joubert, Claude Marchand. Comparative Study of Coil Arrangements for the EC Testing of Small Surface Breaking Defects. Studies in Applied Electromagnetics and Mechanics, 2008, 31, pp.288-293. ⟨hal-00354401⟩
45 Consultations
0 Téléchargements

Partager

More