Comparative Study of Coil Arrangements for the EC Testing of Small Surface Breaking Defects - CentraleSupélec Access content directly
Journal Articles Studies in Applied Electromagnetics and Mechanics Year : 2008

Comparative Study of Coil Arrangements for the EC Testing of Small Surface Breaking Defects

Pierre-Yves Joubert
Claude Marchand
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hal-00354401 , version 1 (19-01-2009)

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  • HAL Id : hal-00354401 , version 1

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Cyril Ravat, Yann Le Bihan, Pierre-Yves Joubert, Claude Marchand. Comparative Study of Coil Arrangements for the EC Testing of Small Surface Breaking Defects. Studies in Applied Electromagnetics and Mechanics, 2008, 31, pp.288-293. ⟨hal-00354401⟩
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