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Conference Papers Year : 2009

Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy

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hal-00445400 , version 1 (08-01-2010)

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  • HAL Id : hal-00445400 , version 1

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Fanny Hauquier, David Alamarguy, Sophie Noël, P. Viel. Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy. MRS Fall Meeting, Nov 2009, Boston, United States. pp.K10.44. ⟨hal-00445400⟩
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