Dielectric properties of semiconducting YBaCuO thin films for future uncooled THz bolometers: characterization using a coaxial-discontinuity technique. - CentraleSupélec Access content directly
Conference Papers Year : 2011

Dielectric properties of semiconducting YBaCuO thin films for future uncooled THz bolometers: characterization using a coaxial-discontinuity technique.

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hal-00710701 , version 1 (21-06-2012)

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  • HAL Id : hal-00710701 , version 1

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Aurélie Gensbittel, Alireza Banisadr, Olivier Dubrunfaut, Jean-Claude Badot, Alain Kreisler, et al.. Dielectric properties of semiconducting YBaCuO thin films for future uncooled THz bolometers: characterization using a coaxial-discontinuity technique.. PIERS 2011: Progress In Electromagnetics Research Symposium, Mar 2011, Marrakesh, Morocco. ⟨hal-00710701⟩
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