Crystal quality characterization of MO-VPE InxGa1-xN thin films using disorder parameters - CentraleSupélec Access content directly
Conference Papers Year : 2011
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hal-00710795 , version 1 (21-06-2012)

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  • HAL Id : hal-00710795 , version 1

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Vanessa Gorge, Anne Migan-Dubois, Christelle Pareige, Zakaria Djebbour, K. Pantzas, et al.. Crystal quality characterization of MO-VPE InxGa1-xN thin films using disorder parameters. E-MRS Spring Meeting 2011, May 2011, Nice, France. ⟨hal-00710795⟩
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