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Year : 2011
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https://centralesupelec.hal.science/hal-00715286
Submitted on : Friday, July 6, 2012-4:01:08 PM
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- HAL Id : hal-00715286 , version 1
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C. Poulain, M. Vincent, L. Chiesi, J. Delamarre, Frédéric Houzé, et al.. Improvement of electrical contacts reliability in a magnetic MEMS switch. Failure analysis - A practical guide for manufacturers of electronic components and systems, John Wiley & Sons Ltd, pp.270-274, 2011. ⟨hal-00715286⟩
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