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Journal Articles International Journal of Applied Electromagnetics and Mechanics Year : 2012

Modeling of thin conductive and magnetic layers in eddy current testing by overlapping finite elements

Abstract

In this paper a new field of application of the overlapping finite element method is proposed for eddy current testing. This method, which has already been used to deal with the lift-off, is extended to the treatment of thin conducting and/or magnetic layers.
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Dates and versions

hal-00779505 , version 1 (22-01-2013)

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Houda Zaidi, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan, Edouard Demaldent. Modeling of thin conductive and magnetic layers in eddy current testing by overlapping finite elements. International Journal of Applied Electromagnetics and Mechanics, 2012, 39 (1-4), pp.341-346. ⟨10.3233/JAE-2012-1480⟩. ⟨hal-00779505⟩
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