Amorphous Y-Ba-Cu-O oxide thin films grown on silicon substrates: optical properties and infrared sensor characterization for future THz imagers - CentraleSupélec Access content directly
Conference Papers Year : 2013

Amorphous Y-Ba-Cu-O oxide thin films grown on silicon substrates: optical properties and infrared sensor characterization for future THz imagers

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hal-00931072 , version 1 (14-01-2014)

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  • HAL Id : hal-00931072 , version 1

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Alain Kreisler, Xavier Galiano, Vishal Jagtap, Annick Dégardin. Amorphous Y-Ba-Cu-O oxide thin films grown on silicon substrates: optical properties and infrared sensor characterization for future THz imagers. Conference of the European Materials Science Society (E-MRS 2013), May 2013, Strasbourg, France. ⟨hal-00931072⟩
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