Characterization of the III-V/Ge interface by capacitance measurements for III-V multijunction solar cells development - CentraleSupélec
Conference Papers Year : 2013

Characterization of the III-V/Ge interface by capacitance measurements for III-V multijunction solar cells development

K. S. Zelentsov
  • Function : Author
A.S. Gudovskikh
  • Function : Author
N.A. Kalyuzhnyy
  • Function : Author
V.M. Lantratov
  • Function : Author
S.A. Mintairov
  • Function : Author
José Alvarez
Laboratoire de génie électrique de Paris
CV
Jean-Paul Kleider
Laboratoire de génie électrique de Paris
CV

Thierry Leblanc  : Connect in order to contact the contributor

https://centralesupelec.hal.science/hal-00931315

Submitted on : Wednesday, January 15, 2014-11:29:53 AM

Last modification on : Friday, March 24, 2023-2:52:58 PM

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hal-00931315 , version 1 (15-01-2014)

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  • HAL Id : hal-00931315 , version 1

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K. S. Zelentsov, A.S. Gudovskikh, N.A. Kalyuzhnyy, V.M. Lantratov, S.A. Mintairov, et al.. Characterization of the III-V/Ge interface by capacitance measurements for III-V multijunction solar cells development. E-MRS Spring Meeting 2013, May 2013, Strasbourg, France. ⟨hal-00931315⟩

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SUPELEC UPMC EC-PARIS CNRS SUP_LGEP CENTRALESUPELEC GEEPS PHEMADIC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE SU-SCIENCES
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