Characterization of N-doped multilayer graphene grown on 4H-SiC (0001) - CentraleSupélec Access content directly
Journal Articles AIP Conference Proceedings Year : 2015

Characterization of N-doped multilayer graphene grown on 4H-SiC (0001)

Citation: 1649

Fichier principal
Vignette du fichier
arezki2015.pdf (1.79 Mo) Télécharger le fichier
Origin : Publisher files allowed on an open archive
Loading...

Dates and versions

hal-01239163 , version 1 (11-03-2020)

Identifiers

Cite

Hakim Arezki, Kuan-I Ho, Alexandre Jaffré, David Alamarguy, J Alvarez, et al.. Characterization of N-doped multilayer graphene grown on 4H-SiC (0001). AIP Conference Proceedings, 2015, 1649, pp.8. ⟨10.1063/1.4913537⟩. ⟨hal-01239163⟩
75 View
104 Download

Altmetric

Share

Gmail Facebook X LinkedIn More