<?xml version="1.0" encoding="utf-8"?>
<TEI xmlns="http://www.tei-c.org/ns/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:hal="http://hal.archives-ouvertes.fr/" xmlns:gml="http://www.opengis.net/gml/3.3/" xmlns:gmlce="http://www.opengis.net/gml/3.3/ce" version="1.1" xsi:schemaLocation="http://www.tei-c.org/ns/1.0 http://api.archives-ouvertes.fr/documents/aofr-sword.xsd">
  <teiHeader>
    <fileDesc>
      <titleStmt>
        <title>HAL TEI export of hal-01774980</title>
      </titleStmt>
      <publicationStmt>
        <distributor>CCSD</distributor>
        <availability status="restricted">
          <licence target="https://creativecommons.org/publicdomain/zero/1.0/">CC0 1.0 - Universal</licence>
        </availability>
        <date when="2026-05-19T11:10:29+02:00"/>
      </publicationStmt>
      <sourceDesc>
        <p part="N">HAL API Platform</p>
      </sourceDesc>
    </fileDesc>
  </teiHeader>
  <text>
    <body>
      <listBibl>
        <biblFull>
          <titleStmt>
            <title xml:lang="en">Never Trust a Cable Bearing Echoes: Understanding Ambiguities in Time-Domain Reflectometry Applied to Soft Faults in Cables</title>
            <author role="aut">
              <persName>
                <forename type="first">Andréa</forename>
                <surname>Cozza</surname>
              </persName>
              <email type="md5">dd5d1cc9e510aed631770db8f0af7deb</email>
              <email type="domain">centralesupelec.fr</email>
              <idno type="idhal" notation="string">andrea-cozza</idno>
              <idno type="idhal" notation="numeric">8868</idno>
              <idno type="halauthorid" notation="string">20318-8868</idno>
              <idno type="ORCID">https://orcid.org/0000-0002-1317-6684</idno>
              <idno type="GOOGLE SCHOLAR">https://scholar.google.fr/citations?user=dKy3eGYAAAAJ&amp;hl=fr</idno>
              <idno type="IDREF">https://www.idref.fr/090944658</idno>
              <affiliation ref="#struct-411302"/>
            </author>
            <editor role="depositor">
              <persName>
                <forename>Andrea</forename>
                <surname>Cozza</surname>
              </persName>
              <email type="md5">dd5d1cc9e510aed631770db8f0af7deb</email>
              <email type="domain">centralesupelec.fr</email>
            </editor>
          </titleStmt>
          <editionStmt>
            <edition n="v1" type="current">
              <date type="whenSubmitted">2018-04-24 11:24:53</date>
              <date type="whenWritten">2018</date>
              <date type="whenModified">2025-12-12 15:22:12</date>
              <date type="whenReleased">2018-04-24 13:46:26</date>
              <date type="whenProduced">2018-04</date>
              <date type="whenEndEmbargoed">2018-04-24</date>
              <ref type="file" target="https://centralesupelec.hal.science/hal-01774980v1/document">
                <date notBefore="2018-04-24"/>
              </ref>
              <ref type="file" subtype="author" n="1" target="https://centralesupelec.hal.science/hal-01774980v1/file/TEMC2017_fault_unindentifiable_final.pdf" id="file-1774980-1805590">
                <date notBefore="2018-04-24"/>
              </ref>
              <ref type="externalLink" target="https://hal-centralesupelec.archives-ouvertes.fr/hal-01774980/file/TEMC2017_fault_unindentifiable_final.pdf"/>
            </edition>
            <respStmt>
              <resp>contributor</resp>
              <name key="146215">
                <persName>
                  <forename>Andrea</forename>
                  <surname>Cozza</surname>
                </persName>
                <email type="md5">dd5d1cc9e510aed631770db8f0af7deb</email>
                <email type="domain">centralesupelec.fr</email>
              </name>
            </respStmt>
          </editionStmt>
          <publicationStmt>
            <distributor>CCSD</distributor>
            <idno type="halId">hal-01774980</idno>
            <idno type="halUri">https://centralesupelec.hal.science/hal-01774980</idno>
            <idno type="halBibtex">cozza:hal-01774980</idno>
            <idno type="halRefHtml">&lt;i&gt;IEEE Transactions on Electromagnetic Compatibility&lt;/i&gt;, 2018, &lt;a target="_blank" href="https://dx.doi.org/10.1109/TEMC.2018.2830404"&gt;&amp;#x27E8;10.1109/TEMC.2018.2830404&amp;#x27E9;&lt;/a&gt;</idno>
            <idno type="halRef">IEEE Transactions on Electromagnetic Compatibility, 2018, &amp;#x27E8;10.1109/TEMC.2018.2830404&amp;#x27E9;</idno>
            <availability status="restricted">
              <licence target="https://about.hal.science/hal-authorisation-v1/">HAL Authorization<ref corresp="#file-1774980-1805590"/></licence>
            </availability>
          </publicationStmt>
          <seriesStmt>
            <idno type="stamp" n="CNRS">CNRS - Centre national de la recherche scientifique</idno>
            <idno type="stamp" n="UNIV-PSUD">Université Paris Sud - Paris XI</idno>
            <idno type="stamp" n="CENTRALESUPELEC">Ecole CentraleSupélec</idno>
            <idno type="stamp" n="GEEPS" corresp="SORBONNE-UNIVERSITE">Laboratoire Génie électrique et électronique de Paris</idno>
            <idno type="stamp" n="PIEM" corresp="GEEPS">Pôle Electromagnétisme</idno>
            <idno type="stamp" n="UNIV-PARIS-SACLAY">Université Paris-Saclay</idno>
            <idno type="stamp" n="UNIV-PSUD-SACLAY" corresp="UNIV-PARIS-SACLAY">Université Paris Sud pour Paris Saclay</idno>
            <idno type="stamp" n="CENTRALESUPELEC-SACLAY" corresp="UNIV-PARIS-SACLAY">CENTRALESUPELEC-SACLAY</idno>
            <idno type="stamp" n="SORBONNE-UNIVERSITE">Sorbonne Université</idno>
            <idno type="stamp" n="SORBONNE-UNIV" corresp="SORBONNE-UNIVERSITE">Sorbonne Université 01/01/2018</idno>
            <idno type="stamp" n="SU-SCIENCES" corresp="SORBONNE-UNIVERSITE">Faculté des Sciences de Sorbonne Université</idno>
            <idno type="stamp" n="GEEPS-ELECTRONIQUE">Equipe Electronique du GeePs</idno>
            <idno type="stamp" n="SU-TI">Sorbonne Université - Texte Intégral</idno>
            <idno type="stamp" n="GS-ENGINEERING">Graduate School Sciences de l'Ingénierie et des Systèmes</idno>
            <idno type="stamp" n="GS-PHYSIQUE">Graduate School Physique</idno>
            <idno type="stamp" n="INSTITUT-SCIENCES-LUMIERE">Institut des Sciences de la Lumière</idno>
            <idno type="stamp" n="ALLIANCE-SU"> Alliance Sorbonne Université</idno>
            <idno type="stamp" n="SUPRA_INGENIERIE">Ingénierie</idno>
          </seriesStmt>
          <notesStmt>
            <note type="audience" n="2">International</note>
            <note type="popular" n="0">No</note>
            <note type="peer" n="1">Yes</note>
          </notesStmt>
          <sourceDesc>
            <biblStruct>
              <analytic>
                <title xml:lang="en">Never Trust a Cable Bearing Echoes: Understanding Ambiguities in Time-Domain Reflectometry Applied to Soft Faults in Cables</title>
                <author role="aut">
                  <persName>
                    <forename type="first">Andréa</forename>
                    <surname>Cozza</surname>
                  </persName>
                  <email type="md5">dd5d1cc9e510aed631770db8f0af7deb</email>
                  <email type="domain">centralesupelec.fr</email>
                  <idno type="idhal" notation="string">andrea-cozza</idno>
                  <idno type="idhal" notation="numeric">8868</idno>
                  <idno type="halauthorid" notation="string">20318-8868</idno>
                  <idno type="ORCID">https://orcid.org/0000-0002-1317-6684</idno>
                  <idno type="GOOGLE SCHOLAR">https://scholar.google.fr/citations?user=dKy3eGYAAAAJ&amp;hl=fr</idno>
                  <idno type="IDREF">https://www.idref.fr/090944658</idno>
                  <affiliation ref="#struct-411302"/>
                </author>
              </analytic>
              <monogr>
                <idno type="halJournalId" status="VALID">14053</idno>
                <idno type="issn">0018-9375</idno>
                <idno type="eissn">1558-187X</idno>
                <title level="j">IEEE Transactions on Electromagnetic Compatibility</title>
                <imprint>
                  <publisher>Institute of Electrical and Electronics Engineers</publisher>
                  <date type="datePub">2018-04</date>
                  <date type="dateEpub">2018-04</date>
                </imprint>
              </monogr>
              <idno type="doi">10.1109/TEMC.2018.2830404</idno>
            </biblStruct>
          </sourceDesc>
          <profileDesc>
            <langUsage>
              <language ident="en">English</language>
            </langUsage>
            <textClass>
              <keywords scheme="author">
                <term xml:lang="en">Transmission line and cable testing</term>
                <term xml:lang="en"> fault identification</term>
                <term xml:lang="en"> soft impedance faults.</term>
              </keywords>
              <classCode scheme="halDomain" n="spi.elec">Engineering Sciences [physics]/Electromagnetism</classCode>
              <classCode scheme="halTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halOldTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halTreeTypology" n="ART">Journal articles</classCode>
            </textClass>
            <abstract xml:lang="en">
              <p>Time-domain reflectometry (TDR), the most widely used testing method for fault-detection in cables, is tested against soft faults of increasing severity. The intensity of TDR echoes is proven to be an unreliable estimator of fault severity, since both the bandwidth of testing signals and the length of the fault have a strong impact on the results. Moreover, it is proven that faults of very different severity may generate virtually identical echoes making it impossible to assess how critical a fault is. Simple frequency-domain estimators are introduced, based on models of a fault reflectivity, leading to minimum requirements for the test bandwidth in order to accurately identify soft faults. As a practical consequence, it is concluded that only faults above a critical length can be accurately identified, implying that no clear decision can be taken about shorter faults.</p>
            </abstract>
          </profileDesc>
        </biblFull>
      </listBibl>
    </body>
    <back>
      <listOrg type="structures">
        <org type="laboratory" xml:id="struct-411302" status="OLD">
          <idno type="IdRef">152859241</idno>
          <idno type="RNSR">199812843Y</idno>
          <orgName>Laboratoire Génie électrique et électronique de Paris</orgName>
          <orgName type="acronym">GeePs</orgName>
          <date type="start">2015-01-01</date>
          <date type="end">2018-12-31</date>
          <desc>
            <address>
              <addrLine>11, rue Joliot CuriePlateau de Moulon91192 Gif sur Yvette</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://geeps.lgep.supelec.fr/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-92966" type="direct"/>
            <relation active="#struct-93591" type="direct"/>
            <relation active="#struct-411575" type="direct"/>
            <relation name="UMR8507" active="#struct-441569" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-92966" status="OLD">
          <idno type="ROR">https://ror.org/028rypz17</idno>
          <orgName>Université Paris-Sud - Paris 11</orgName>
          <orgName type="acronym">UP11</orgName>
          <date type="end">2019-12-31</date>
          <desc>
            <address>
              <addrLine>Bâtiment 300 - 91405 Orsay cedex</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.u-psud.fr/</ref>
          </desc>
        </org>
        <org type="institution" xml:id="struct-93591" status="OLD">
          <idno type="ROR">https://ror.org/02en5vm52</idno>
          <orgName>Université Pierre et Marie Curie - Paris 6</orgName>
          <orgName type="acronym">UPMC</orgName>
          <date type="end">2017-12-31</date>
          <desc>
            <address>
              <addrLine>4 place Jussieu - 75005 Paris</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.upmc.fr/</ref>
          </desc>
        </org>
        <org type="institution" xml:id="struct-411575" status="VALID">
          <idno type="IdRef">184443237</idno>
          <idno type="ROR">https://ror.org/019tcpt25</idno>
          <orgName>CentraleSupélec</orgName>
          <desc>
            <address>
              <addrLine>3, rue Joliot Curie,Plateau de Moulon,91192 GIF-SUR-YVETTE Cedex</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.centralesupelec.fr</ref>
          </desc>
        </org>
        <org type="regroupinstitution" xml:id="struct-441569" status="VALID">
          <idno type="IdRef">02636817X</idno>
          <idno type="ISNI">0000000122597504</idno>
          <idno type="ROR">https://ror.org/02feahw73</idno>
          <orgName>Centre National de la Recherche Scientifique</orgName>
          <orgName type="acronym">CNRS</orgName>
          <date type="start">1939-10-19</date>
          <desc>
            <address>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.cnrs.fr/</ref>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>