Modelling the imperfections of analog circuits using Second-Order Statistics - CentraleSupélec Access content directly
Conference Papers Year : 2006

Modelling the imperfections of analog circuits using Second-Order Statistics

Abstract

The analog parts of mixed analog-digital systems are always subject to some imperfections. Considering Linear Time-Invariant (LTI) analog circuits, the real transfer function is then practically different from the desired nominal one and includes some deviations. The goal of this paper is to offer a model which digitally estimates the deviations from typical values supposing that the only available information is the sampled analog output (blind estimation). The model is independent from the type of the imperfections sources and is applicable when the input is a white noise (either Gaussian or non-Gaussian). The model has been applied to several RC and RLC circuits and the performance of the estimation is studied. The simulations show that the model can estimate the analog imperfections of §20% with a precision §4% in first- and second-order circuits which may be useful in correction purposes such as compensation.
Fichier principal
Vignette du fichier
ICSSPS_2006_Marrakesh.pdf (94.99 Ko) Télécharger le fichier
Origin Files produced by the author(s)
Loading...

Dates and versions

hal-00255872 , version 1 (14-02-2008)

Identifiers

  • HAL Id : hal-00255872 , version 1

Cite

Davud Asemani, Jacques Oksman, Daniel Poulton. Modelling the imperfections of analog circuits using Second-Order Statistics. 2nd IEEE International Symposium on Communications, Control and signal Processing, Mar 2006, Marrakech, Morocco. pp.CD-ROM Proceedings. ⟨hal-00255872⟩
60 View
112 Download

Share

Gmail Mastodon Facebook X LinkedIn More