Control of Yeast Fed-Batch Cultures using Minimal a priori Process Knowledge and Measurement Information - CentraleSupélec Access content directly
Journal Articles Journal of Process Control Year : 2006

Control of Yeast Fed-Batch Cultures using Minimal a priori Process Knowledge and Measurement Information

F. Renard
  • Function : Author
A. Vande Wouwer
  • Function : Author
S. Valentinotti
  • Function : Author
Didier Dumur

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Dates and versions

hal-00279668 , version 1 (15-05-2008)

Identifiers

  • HAL Id : hal-00279668 , version 1

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F. Renard, A. Vande Wouwer, S. Valentinotti, Didier Dumur. Control of Yeast Fed-Batch Cultures using Minimal a priori Process Knowledge and Measurement Information. Journal of Process Control, 2006, pp.1-10. ⟨hal-00279668⟩
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