Conference Papers
Year : 2005
Olivier Schneegans : Connect in order to contact the contributor
https://centralesupelec.hal.science/hal-00320256
Submitted on : Wednesday, September 10, 2008-3:18:23 PM
Last modification on : Friday, March 24, 2023-2:52:50 PM
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- HAL Id : hal-00320256 , version 1
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Pascal Chrétien, Frédéric Houzé, Olivier Schneegans, René Meyer, Lionel Boyer. Simultaneous resistance and capacitance cartography by conducting probe AFM in contact mode. Xtip'05, 2005, France. ⟨hal-00320256⟩
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