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Conference Papers Year : 2005

Simultaneous resistance and capacitance cartography by conducting probe AFM in contact mode

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hal-00320256 , version 1 (10-09-2008)

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  • HAL Id : hal-00320256 , version 1

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Pascal Chrétien, Frédéric Houzé, Olivier Schneegans, René Meyer, Lionel Boyer. Simultaneous resistance and capacitance cartography by conducting probe AFM in contact mode. Xtip'05, 2005, France. ⟨hal-00320256⟩
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