Electrical characterization of ITO/CuPc/Al diodes using temperature dependent capacitance spectroscopy and I-V measurements - CentraleSupélec Access content directly
Journal Articles Journal of Non-Crystalline Solids Year : 2004

Electrical characterization of ITO/CuPc/Al diodes using temperature dependent capacitance spectroscopy and I-V measurements

F.T. Reis
  • Function : Author
Isabelle Séguy
M. Oukachmih
  • Function : Author
Pascale Jolinat
  • Function : Author
  • PersonId : 1247389
P. Destruel
  • Function : Author
  • PersonId : 1248406
  • IdRef : 075883791
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Dates and versions

hal-00320881 , version 1 (11-09-2008)

Identifiers

  • HAL Id : hal-00320881 , version 1

Cite

F.T. Reis, Denis Mencaraglia, Sidi Ould Saad, Isabelle Séguy, M. Oukachmih, et al.. Electrical characterization of ITO/CuPc/Al diodes using temperature dependent capacitance spectroscopy and I-V measurements. Journal of Non-Crystalline Solids, 2004, 338-340, pp.599-602. ⟨hal-00320881⟩
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