Photoconductivity measurements used to determine the defect density within the gap of intrinsic semiconductors - CentraleSupélec Access content directly
Conference Papers Year : 2005

Photoconductivity measurements used to determine the defect density within the gap of intrinsic semiconductors

J.A. Schmidt
  • Function : Author
R.R. Koropecki
  • Function : Author
R. Arce
  • Function : Author
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Dates and versions

hal-00321562 , version 1 (15-09-2008)

Identifiers

  • HAL Id : hal-00321562 , version 1

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J.A. Schmidt, Christophe Longeaud, R.R. Koropecki, R. Arce. Photoconductivity measurements used to determine the defect density within the gap of intrinsic semiconductors. Hyperfine Interaction at La Plata, 2005, Argentina. ⟨hal-00321562⟩
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