Local electrical and photoelectrical characterizations of diamond electronic devices by conducting probe atomic force microscopy - CentraleSupélec Access content directly
Conference Papers Year : 2006

Local electrical and photoelectrical characterizations of diamond electronic devices by conducting probe atomic force microscopy

José Alvarez
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hal-00321893 , version 1 (16-09-2008)

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  • HAL Id : hal-00321893 , version 1

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José Alvarez. Local electrical and photoelectrical characterizations of diamond electronic devices by conducting probe atomic force microscopy. National Institute of Materials Science, 2006, Japan. ⟨hal-00321893⟩
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