New method for interface characterization in heterojunction solar cells based on diffusion capacitance measurements - CentraleSupélec Access content directly
Journal Articles Thin Solid Films Year : 2008

New method for interface characterization in heterojunction solar cells based on diffusion capacitance measurements

A.S. Gudovskikh
  • Function : Author
N.A. Kaluzhniy
  • Function : Author
V. Lantratov
  • Function : Author
S.A. Mintairov
  • Function : Author
J. Damon-Lacoste
  • Function : Author
D. Eon
  • Function : Author
Pere Roca I Cabarrocas
P.J. Ribeyron
  • Function : Author
No file

Dates and versions

hal-00350881 , version 1 (07-01-2009)

Identifiers

  • HAL Id : hal-00350881 , version 1

Cite

A.S. Gudovskikh, Rémy Chouffot, Jean-Paul Kleider, N.A. Kaluzhniy, V. Lantratov, et al.. New method for interface characterization in heterojunction solar cells based on diffusion capacitance measurements. Thin Solid Films, 2008, 516, pp.6786. ⟨hal-00350881⟩
45 View
0 Download

Share

Gmail Facebook X LinkedIn More