Focused ion beam processing of organic crystal (TMTSF)2PF6. A combined conducting probe atomic force microscopy and secondary ion mass spectrometry study - CentraleSupélec Access content directly
Journal Articles Journal of Applied Physics Year : 2008

Focused ion beam processing of organic crystal (TMTSF)2PF6. A combined conducting probe atomic force microscopy and secondary ion mass spectrometry study

K. Wang
  • Function : Author
A. Moradpour
  • Function : Author
F. Jomard
  • Function : Author
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Dates and versions

hal-00351341 , version 1 (09-01-2009)

Identifiers

  • HAL Id : hal-00351341 , version 1

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K. Wang, Olivier Schneegans, A. Moradpour, F. Jomard. Focused ion beam processing of organic crystal (TMTSF)2PF6. A combined conducting probe atomic force microscopy and secondary ion mass spectrometry study. Journal of Applied Physics, 2008, 103, pp.013711. ⟨hal-00351341⟩
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