Conference Papers
Year : 2008
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https://centralesupelec.hal.science/hal-00353081
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Last modification on : Tuesday, November 7, 2023-11:43:28 AM
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- HAL Id : hal-00353081 , version 1
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Cyril Ravat, P.-Y. Joubert, Yann Le Bihan, Claude Marchand. Non destructive evaluation of small defects using an eddy current microcoil sensor array. EMSA 2008 Conference, Jul 2008, Caen, France. ⟨hal-00353081⟩
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