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Journal Articles Thin Solid Films Year : 2009

Electronic and structural properties of the amorphous/crystalline silicon interface

A.S. Gudovskikh
  • Function : Author
Pere Roca I Cabarrocas
M. Labrune
  • Function : Author
P.J. Ribeyron
  • Function : Author
R. Brüggemann
  • Function : Author
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Dates and versions

hal-00445964 , version 1 (11-01-2010)

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  • HAL Id : hal-00445964 , version 1

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Jean-Paul Kleider, Rémy Chouffot, A.S. Gudovskikh, Pere Roca I Cabarrocas, M. Labrune, et al.. Electronic and structural properties of the amorphous/crystalline silicon interface. Thin Solid Films, 2009, 517, pp. 6386-6391. ⟨hal-00445964⟩
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