Conference Papers
Year : 2009
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https://centralesupelec.hal.science/hal-00447250
Submitted on : Thursday, January 14, 2010-3:46:39 PM
Last modification on : Friday, March 24, 2023-2:52:52 PM
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- HAL Id : hal-00447250 , version 1
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Yahya Choua, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Mesh Refinement in Eddy Current Testing with Separated T-R probes. COMPUMAG, Nov 2009, Florianópolis, Brazil. pp. 1048-1049. ⟨hal-00447250⟩
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