Conference Papers
Year : 2010
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https://centralesupelec.hal.science/hal-00554772
Submitted on : Tuesday, January 11, 2011-1:06:31 PM
Last modification on : Friday, March 24, 2023-2:52:54 PM
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- HAL Id : hal-00554772 , version 1
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Romaric Landfried, Thierry Leblanc, Richard Andlauer, T. Klonowski, Philippe Testé. Temperature Measurement of Copper Contact Surfaces. 25th ICEC and 56th Holm Conference on Electrical Contacts, Oct 2010, Charleston, United States. pp.148-152. ⟨hal-00554772⟩
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