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Conference Papers Year : 2010

Temperature Measurement of Copper Contact Surfaces

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hal-00554772 , version 1 (11-01-2011)

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  • HAL Id : hal-00554772 , version 1

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Romaric Landfried, Thierry Leblanc, Richard Andlauer, T. Klonowski, Philippe Testé. Temperature Measurement of Copper Contact Surfaces. 25th ICEC and 56th Holm Conference on Electrical Contacts, Oct 2010, Charleston, United States. pp.148-152. ⟨hal-00554772⟩
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