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Conference Papers Year : 2010

Conductive-atomic force microscopy characterization of silicon nanowires

José Alvarez
Marie-Estelle Gueunier-Farret
Lianbo Yu
  • Function : Author
Pere Roca I Cabarrocas
Simon Perraud
  • Function : Author
E. Rouvière
  • Function : Author
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Dates and versions

hal-00555251 , version 1 (12-01-2011)

Identifiers

  • HAL Id : hal-00555251 , version 1

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José Alvarez, Irène Ngo, Marie-Estelle Gueunier-Farret, Jean-Paul Kleider, Lianbo Yu, et al.. Conductive-atomic force microscopy characterization of silicon nanowires. E-MRS 2010 Fall Meeting, Sep 2010, Varsovie, Poland. ⟨hal-00555251⟩
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