Conference Papers
Year : 2010
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https://centralesupelec.hal.science/hal-00555256
Submitted on : Wednesday, January 12, 2011-5:23:28 PM
Last modification on : Friday, March 24, 2023-2:52:54 PM
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- HAL Id : hal-00555256 , version 1
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Jean-Paul Kleider. Capacitance techniques for the evaluation of electronic properties and defects in disordered thin film semiconductors. 7th International Conference on amorphous and microcrystalline semiconductors, Jun 2010, Saint-Petersburg, Russia. pp.00. ⟨hal-00555256⟩
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