Capacitance techniques for the evaluation of electronic properties and defects in disordered thin film semiconductors - CentraleSupélec Access content directly
Conference Papers Year : 2010

Capacitance techniques for the evaluation of electronic properties and defects in disordered thin film semiconductors

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hal-00555256 , version 1 (12-01-2011)

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  • HAL Id : hal-00555256 , version 1

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Jean-Paul Kleider. Capacitance techniques for the evaluation of electronic properties and defects in disordered thin film semiconductors. 7th International Conference on amorphous and microcrystalline semiconductors, Jun 2010, Saint-Petersburg, Russia. pp.00. ⟨hal-00555256⟩
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