Conference Papers
Year : 2010
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https://centralesupelec.hal.science/hal-00555709
Submitted on : Friday, January 14, 2011-11:24:48 AM
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- HAL Id : hal-00555709 , version 1
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Alejandro Ospina Vargas, Houda Zaidi, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan. Comparison of two methods for modeling thin regions in eddy current non-destructive testing. CEFC 2010, May 2010, Chicago, IL, United States. ⟨hal-00555709⟩
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