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Conference Papers Year : 2010

Comparison of two methods for modeling thin regions in eddy current non-destructive testing

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hal-00555709 , version 1 (14-01-2011)

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  • HAL Id : hal-00555709 , version 1

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Alejandro Ospina Vargas, Houda Zaidi, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan. Comparison of two methods for modeling thin regions in eddy current non-destructive testing. CEFC 2010, May 2010, Chicago, IL, United States. ⟨hal-00555709⟩
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