Observation by conductive-probe atomic force microscopy of strongly inverted surface layers at the hydrogenated amorphous silicon/crystalline silicon heterojunctions - CentraleSupélec Access content directly
Journal Articles Applied Physics Letters Year : 2010

Observation by conductive-probe atomic force microscopy of strongly inverted surface layers at the hydrogenated amorphous silicon/crystalline silicon heterojunctions

José Alvarez
E.V. Gushina
  • Function : Author
Marie-Estelle Gueunier-Farret
A.S. Gudovskikh
  • Function : Author
A.V. Ankudinov
  • Function : Author
E.I Terukov
  • Function : Author
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hal-00557102 , version 1 (18-01-2011)

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  • HAL Id : hal-00557102 , version 1

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Olga Alexandrovna Maslova, José Alvarez, E.V. Gushina, Wilfried Favre, Marie-Estelle Gueunier-Farret, et al.. Observation by conductive-probe atomic force microscopy of strongly inverted surface layers at the hydrogenated amorphous silicon/crystalline silicon heterojunctions. Applied Physics Letters, 2010, 97 (25), pp.252110. ⟨hal-00557102⟩
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