Coil-to-sample distance influence on contactless QSSPC effective lifetime measurements : application to silicon wafers passivated by thin amorphous layers - CentraleSupélec Access content directly
Conference Papers Year : 2011

Coil-to-sample distance influence on contactless QSSPC effective lifetime measurements : application to silicon wafers passivated by thin amorphous layers

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hal-00710780 , version 1 (21-06-2012)

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  • HAL Id : hal-00710780 , version 1

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Wilfried Favre, Laroussi Bettaieb, J. Després, José Alvarez, Jean-Paul Kleider, et al.. Coil-to-sample distance influence on contactless QSSPC effective lifetime measurements : application to silicon wafers passivated by thin amorphous layers. 26th EU PVSEC, Sep 2011, Hambourg, Germany. ⟨hal-00710780⟩
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