Conductive-atomic force microscopy and Raman spectroscopy characterization of silicon nanowires - CentraleSupélec Access content directly
Conference Papers Year : 2011
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hal-00710790 , version 1 (21-06-2012)

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  • HAL Id : hal-00710790 , version 1

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Morgane Fruzzetti, José Alvarez, Irène Ngo, Marie-Estelle Gueunier-Farret, Jean-Paul Kleider, et al.. Conductive-atomic force microscopy and Raman spectroscopy characterization of silicon nanowires. Journées Nationales PhotoVoltaïques 2011, Dec 2011, Dourdan, France. ⟨hal-00710790⟩
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