Amorphous Y-Ba-Cu-O oxygen-depleted thin films on silicon: wide frequency band dielectric characterizations help probing application to room temperature infrared detection - CentraleSupélec Access content directly
Conference Papers Year : 2012

Amorphous Y-Ba-Cu-O oxygen-depleted thin films on silicon: wide frequency band dielectric characterizations help probing application to room temperature infrared detection

Jérôme de Lambert
  • Function : Author
Brice Leduc
  • Function : Author
Alain Kreisler
Annick Dégardin
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Dates and versions

hal-00780529 , version 1 (24-01-2013)

Identifiers

  • HAL Id : hal-00780529 , version 1

Cite

Aurélie Gensbittel, Jérôme de Lambert, Brice Leduc, Olivier Dubrunfaut, Alain Kreisler, et al.. Amorphous Y-Ba-Cu-O oxygen-depleted thin films on silicon: wide frequency band dielectric characterizations help probing application to room temperature infrared detection. Conference of the European Materials Science Society (E-MRS 2012), May 2012, Strasbourg, France. ⟨hal-00780529⟩
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