Characterization of a 3D defect using the Expected Improvement algorithm
Résumé
This paper provides a new methodology for the characterization of a defect embedded in a conductive non-magnetic plate from the measurement of the impedance vari-ations of an air-cored pancake coil at eddy current frequen-cies. The inversion problem is dealt with using the Expected Improvement (EI) global optimization algorithm. The effi-ciency of the approach is discussed in the light of preliminary numerical examples obtained using synthetic data.
Domaines
Electromagnétisme| Origine | Fichiers produits par l'(les) auteur(s) |
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