Passivated Selective Contact Structure Characterization by C-AFM and KPFM of the Conduction by Pinholes - CentraleSupélec Access content directly
Conference Poster Year : 2019

Passivated Selective Contact Structure Characterization by C-AFM and KPFM of the Conduction by Pinholes

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hal-02344005 , version 1 (03-11-2019)

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  • HAL Id : hal-02344005 , version 1

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Clément Marchat, Audrey Morisset, José Alvarez, Raphaël Cabal, Marie-Estelle Gueunier, et al.. Passivated Selective Contact Structure Characterization by C-AFM and KPFM of the Conduction by Pinholes. 28th International Conference on Amorphous and nanocrystalline Semiconductors (ICANS 28), Aug 2019, Palaiseau, France. ⟨hal-02344005⟩
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