Reliability of etching angle estimation of MEMS resonators from electrical measurements - CentraleSupélec Access content directly
Conference Papers Year : 2019
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hal-02907054 , version 1 (27-07-2020)

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Alexis Brenes, Bogdan Vysotskyi, Elie Lefeuvre, Jérôme Juillard. Reliability of etching angle estimation of MEMS resonators from electrical measurements. 2019 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP), May 2019, Paris, France. pp.1-4, ⟨10.1109/DTIP.2019.8752716⟩. ⟨hal-02907054⟩
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