Method of contactless measurement of the conductivity of semiconductors, said method being implemented by: a first assembly comprising a signal emission/reception system —a second assembly comprising at least one semi-conducting target and an inductor element, —a third assembly, said method comprising at least the following steps: a) the first assembly emits a multifrequency signal, b) the second assembly reflects or transmits at least one part of the multifrequency signal emitted, c) the first assembly receives the reflected multifrequency signal reflected by the second assembly, d) the third assembly calculates the coefficient of reflection or of transmission of the emitted signal, e) the third assembly provides the conductivity of the semiconducting target.