Investigation of a-Si:H/c-Si heterojunction interface properties by admittance spectroscopy - CentraleSupélec Access content directly
Conference Papers Year : 2004

Investigation of a-Si:H/c-Si heterojunction interface properties by admittance spectroscopy

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hal-00321101 , version 1 (12-09-2008)

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  • HAL Id : hal-00321101 , version 1

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Alexander Gudovskikh, Jean-Paul Kleider. Investigation of a-Si:H/c-Si heterojunction interface properties by admittance spectroscopy. 4th AMS (international conference on Amorphous ans Microcrystalline Semiconductors), 2004, Russia. ⟨hal-00321101⟩
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