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Journal Articles Semiconductors Year : 2005

Characterization of a-Si:H/c-Si interface by admittance spectroscopy

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hal-00321250 , version 1 (12-09-2008)

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  • HAL Id : hal-00321250 , version 1

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Alexander Gudovskikh, Jean-Paul Kleider, E.I. Terukov. Characterization of a-Si:H/c-Si interface by admittance spectroscopy. Semiconductors, 2005, 39, pp.903-909. ⟨hal-00321250⟩
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