Journal Articles
Semiconductors
Year : 2005
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https://centralesupelec.hal.science/hal-00321250
Submitted on : Friday, September 12, 2008-4:19:46 PM
Last modification on : Friday, March 24, 2023-2:52:50 PM
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- HAL Id : hal-00321250 , version 1
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Alexander Gudovskikh, Jean-Paul Kleider, E.I. Terukov. Characterization of a-Si:H/c-Si interface by admittance spectroscopy. Semiconductors, 2005, 39, pp.903-909. ⟨hal-00321250⟩
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