The modulated photocurrent technique: comparison of the high and low frequency regimes for the characterisation of bandgap states in thin films semiconductors - CentraleSupélec Access content directly
Conference Papers Year : 2005

The modulated photocurrent technique: comparison of the high and low frequency regimes for the characterisation of bandgap states in thin films semiconductors

No file

Dates and versions

hal-00321563 , version 1 (15-09-2008)

Identifiers

  • HAL Id : hal-00321563 , version 1

Cite

Marie-Estelle Gueunier-Farret, Jean-Paul Kleider, Christophe Longeaud. The modulated photocurrent technique: comparison of the high and low frequency regimes for the characterisation of bandgap states in thin films semiconductors. a-SiNet Workshop, 2005, Netherlands. ⟨hal-00321563⟩
22 View
0 Download

Share

Gmail Mastodon Facebook X LinkedIn More