Influence of the amorphous/crystalline silicon heterostructure properties on planar conductance measurements - CentraleSupélec
Conference Papers Year : 2011

Influence of the amorphous/crystalline silicon heterostructure properties on planar conductance measurements

Olivier Schneegans  : Connect in order to contact the contributor

https://centralesupelec.hal.science/hal-00710775

Submitted on : Thursday, June 21, 2012-3:53:38 PM

Last modification on : Friday, March 24, 2023-2:52:55 PM

No file

Dates and versions

hal-00710775 , version 1 (21-06-2012)

Identifiers

  • HAL Id : hal-00710775 , version 1

Cite

Renaud Varache, Wilfried Favre, Lars Korte, Jean-Paul Kleider. Influence of the amorphous/crystalline silicon heterostructure properties on planar conductance measurements. ICANS24, Aug 2011, Nara, Japan. ⟨hal-00710775⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

SUPELEC UPMC EC-PARIS CNRS SUP_LGEP CENTRALESUPELEC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE
37 View
0 Download

Share

More