Characterization of a 3D defect using the Expected Improvement algorithm - CentraleSupélec Access content directly
Conference Papers Year :

Characterization of a 3D defect using the Expected Improvement algorithm

Abstract

This paper provides a new methodology for the characterization of a defect embedded in a conductive nonmagnetic plate from the measurement of the impedance variations of an air-cored pancake coil at eddy current frequencies. The inversion problem is dealt with using the Expected Improvement (EI) global optimization algorithm. The efficiency of the approach is discussed in the light of preliminary numerical examples obtained using synthetic data.
Fichier principal
Vignette du fichier
BiliczIGTE-2008-full_final.pdf (127.71 Ko) Télécharger le fichier
Origin : Files produced by the author(s)

Dates and versions

hal-01104089 , version 2 (19-01-2009)
hal-01104089 , version 1 (16-01-2015)

Identifiers

  • HAL Id : hal-01104089 , version 2

Cite

S. Bilicz, Emmanuel Vazquez, Marc Lambert, S. Gyimothy, J. Pavo. Characterization of a 3D defect using the Expected Improvement algorithm. 13th IGTE - Symposium on Numerical Field Calculation in Electrical Engineering, Sep 2008, Graz, Austria. ⟨hal-01104089v2⟩
405 View
341 Download

Share

Gmail Facebook Twitter LinkedIn More